Highly sensitive reflection high-energy electron diffraction measurement by use of micro-channel imaging plate
نویسندگان
چکیده
Micro-channel plate ~MCP! was used to intensify the image on the fluorescent screen in reflection high-energy electron diffraction. The primary electron current could be reduced by four orders of magnitude to get the image of the same intensity as in the measurement without MCP. The reduction of electron beam enabled observation of ionic crystal surfaces without causing electrolysis and charging effect. © 2000 American Institute of Physics. @S0034-6748~00!02309-1#
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